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RTESPA-300 80 nm Click here for an example

SKU: 91051967716

4.9
EUR293.08 EUR328.08

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Ships within 48 hours · Estimated delivery Aug 3 - Aug 8

Description

Click here for an example

5 Tip Radius (Nom): 10 Tip Radius (Max): 15 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3

Conductive PtIr Coating

FastScan-C probes are designed specifically for imaging in fluid on the Dimension FastScan AFM

Built on the high-performance RFESP-75 AFM probe

RTESPA-300 80 nm Click here for an example40N m, 300kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for TappingMode andother non contact modes. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the most

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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