292nm Pitch High Magnification, High Resolution Calibration Standard for AFM Select:Non-traceable Chip carrier for unmounted cantilevers

Chip carrier for unmounted cantilevers

The 607-STM Grating Replica is a carbon replica with Au/Pd shadowing for X-Y calibration with 2

5 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtIr Back Side Coating: Reflective PtIr

6 ohm/square/mil

Tip Geometry: Pyramid Tip Height: 4

292nm Pitch High Magnification, High Resolution Calibration Standard for AFM Select:Non-traceable Chip carrier for unmounted cantileversDESCRIPTION Precision holographic grating standard with high contrast and excellent edge definition. Period: 292nm pitch nominal, one dimensional array. Accuracy is + 1%. Calibration certificate will give the actual pitch of the standard. Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable