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New ScanAsyst and PeakForce Tapping probes designed for applications in a high-volume environment on samples with high optical reflectivity that may cause laser interference and feedback into the AFM's optical position-sensitive detector
For the highest resolution nanoelectrical measurements with outstanding wear resistance
4 each 3 bar
where the specifications are met through tight manufacturing tolerances and not by individual per die measurements
10 pack of probes for use in the nanoIR2-s system for AFM imaging in tapping mode and for use with the scattering SNOM technique
SM-nIR2-Flat-5 X1D New ScanAsyst and PeakForce TappingDESCRIPTION 5 pack of zinc sulfide sample substrates for use with nanoIR2
US$ 27.00
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US$ 75.00
US$ 25.00
US$ 52.00
US$ 18.51
US$ 12.00
