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Planotec Silicon Calibration Specimen - 10µm Pitch nominal 8nm 01702G - Formvar

SKU: 80275314368

4.1
EUR135.55 EUR184.55

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Ships within 48 hours · Estimated delivery Aug 5 - Aug 10

Description

01702G - Formvar

Can also be used on JEOL stage adapters or specimen holders which accommodate the 15mm cylinder stub

Will take notations

Alexander J

16mm dia x 25mm H with M4 screw

Planotec Silicon Calibration Specimen - 10µm Pitch nominal 8nm 01702G - FormvarDESCRIPTION Useful for magnification calibration or image distortion check in SEM and LM. Single crystal silicon, 5mm x 5mm. The squares repeat every 10m (0. 01mm). The dividing lines are about 1. 9m wide, formed by electron beam lithography. A broader marking line is written every 500m (0. 5mm) which is useful for light microscopy. Lines are etched, and approximately 300nm deep. Available unmounted or mounted on SEM specimen mounts. A certificate of

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