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Standard Cu
medium and high resolution gap tests are performed on the same specimen
detection of lateral nonlinearity
electronic industry
Bow: ≤20µm
NPV-10 Aluminum Standard CuNPV 10 Silicon Nitride probe for general contact mode imaging and force measurements in air and liquid. 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS NPV 10 Silicon Nitride probe for general contact mode imaging and force measurements in air and liquid. 4 triangular silicon nitride cantilevers provide spring constants from 0. 06 to 0. 35 N m. 0. 06 to 0. 35 N m, 20nm tip radius, gold reflex coating 10 probes per pack Compatible with
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