FIB Lift-Out Grids for Inverted Sample Preparation Ted Pella 10mm 5627-TEF DUMONT High Precision

10mm 5627-TEF DUMONT High Precision PTFE coated 7 115mm PTFE coated SS 0

Hitachi M4 adapter to standard 12

Focused Ion Beam (FIB) probes consist of an integrated single crystal TESP silicon cantilever and tip that have been machined (or shaped) toobtain the desired high aspect ratio

Each pattern has five bars and spaces of equal pitch:10

Cup or Tip

FIB Lift-Out Grids for Inverted Sample Preparation Ted Pella 10mm 5627-TEF DUMONT High PrecisionDESCRIPTION Three post molybdenum grids with an extended rim which allows the grid to be held in an inverted position for easier backside FIB milling and superior thinning. Sometimes referred to as scorpion grids or scorpion tail grids, each grid can hold up to 8 lamellae. Grids are 3mm in diameter and ship in a Gel Box of 50 grids. 16560 FIB Lift Out Grids for Inverted Sample Prep, 3 posts, molybdenum, pkg 50