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The FastScan-C cantilevers utilize a novel 40 um long triangular Silicon Nitride cantilever to achieve a 300 kHz resonant frequency with only a 0
5N/m - From 3N/m To 12N/m Resonance Frequency 19kHz - From 16kHz To 24kHz Resonance Frequency 110 - From 80kHz To 140kHz Length 500µm - From 490µm To 510µm Length 210µm - From 200µm To 220µm Width 30µm - From 25µm To 35µm Width 30µm - From 25µm To 35µm Thickness 2
4nm (95% confidence interval)
#15319 Standard Pin Adapter to M4 (2 each)
Type: P / Dopant: Boron
PR-UM-TNIR-A-10 AFM and Scanning Probe Microscopy Calibration The FastScan-C cantilevers utilize aDESCRIPTION SPECIFICATIONS A 10 pack of probes for tapping mode imaging and nanoIR spectroscopic measurements. Unmounted for use on Brukers IconIR system or others systems that can take a standard cantilever chip. This 75khz tapping mode probe has a full wrap gold coating, on the reflex side for increased feedback laser signal, on the tip side to enable nanoIR measurements. General Specifications Feature Value Geometry Rectangular Tip Radius (nm)
