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The PS regions of the sample have elastic modulus numbers around 2GPa
5 Cantilever Geometry: Rectangular Cantilevers Number: 1
sMIM probes
Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries
One cartridge for IRIS STM TERS
NCLV Wear Resistant The PS regions of the48N m, 190kHz, No Reflective Coat, 10Pk DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of Silicon Probes. Quantity=10 Bruker's Value Line Long Lever TappingMode imaging probes. This probe is also available with Aluminum reflex coating as model NCLV A. Specifications: 48N m, 190kHz, No Reflective Coating. Unmounted for use on any AFM. Tip Geometry: Standard (Steep) Tip Height: 10 15 Front Angle: 25 2. 5 Back Angle: 15 2. 5 Side Angle:
